Highscore Workshop
Date: Monday 25 August 2025
Time: to be announced
Venue: Faculty of Chemistry, Adam Mickiewicz University in Poznań.
Registration Fee: 25 EUR (academic), 150 EUR (industry)
How to register: ECM35 Registration Form
Number of seats: 50
Website:
https://ecm35.syskonf.pl/highscore
Synopsis
This hands-on workshop will provide a comprehensive introduction to phase identification and Rietveld refinement using the HighScore Suite software. Participants will learn the fundamentals of X-ray diffraction (XRD) data analysis, including phase identification, crystal structure refinement, quantitative phase analysis and structure determination. Through practical exercises, attendees will explore:
- Data import and pre-processing (background correction, peak fitting).
- Rietveld refinement strategies for accurate structural and microstructural analysis.
- Advanced features (e.g., crystallite size/strain determination, automatic data treatment via batches/scripting).
- Troubleshooting common refinement challenges.
Designed for beginners and intermediate users, this workshop combines lectures with live demonstrations, ensuring participants gain the skills to confidently analyze XRD data for materials science, chemistry, and geology applications.
Prerequisites: Basic knowledge of XRD and crystallography recommended.
Program
to be announced
Organizers:
Gwilherm Nénert, Milen Gateshki, Piotr Jakiela; Malvern Panalytical
Contact
Gwilherm.nenert@malvernpanalytical.com